Zu Hauptinhalt springen
Gewählte Sprache ist Deutsch Select language
Startseite UR

Publikationen


2017


  1. Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures

    Ferdinand Huber and Franz J. Giessibl

    Rev. Sci. Instrum., 88, 073702 (2017)

  1. Non-contact lateral force microscopy

    Alfred J. Weymouth

      J. Phys.: Condens. Matter, 29, 323001 (2017)


2016


  1. Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy

    Hiroaki Ooe, Dominik Kirpal, Daniel S. Wastl, Alfred J. Weymouth, Toyoko Arai and Franz J. Giessibl

    Appl. Phys. Lett, 109, 141603 (2016)
  1. Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy

    Angelo Peronio and Franz J. Giessibl

    Phys. Rev. B, 94, 094503 (2016)

  1. Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory

    Norio Okabayashi, Alexander Gustafsson, Angelo Peronio, Magnus Paulsson, Toyoko Arai, and Franz J. Giessibl

    Phys. Rev. B, 93, 165415 (2016)


2015


  1. Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature

    F. Huber, S. Matencio, A.J. Weymouth, C. Ocal, E. Barrena, and F.J. Giessibl

    Phys. Rev. Lett, 115, 066101 (2015)

Also highlighted in:

- APS Physics, 8, 76


  1. Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip

    Matthias Emmrich, Maximilian Schneiderbauer, Ferdinand Huber, Alfred J. Weymouth, Norio Okabayashi, and Franz J. Giessibl

    Phys. Rev. Lett, 114, 146101 (2015)

  1. Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips

    Daniel S. Wastl, Michael Judmann, Alfred J. Weymouth, and Franz J. Giessibl

    ACS Nano, DOI: 10.1021/acsnano.5b01549 (2015)

  1. Oligolayer-Coated Nanoparticles: Impact of Surface Topography at the Nanobio Interface

    Eva-Christina Wurster, Renate Liebl, Stefanie Michaelis, Rudolf Robelek, Daniel S. Wastl, Franz J. Giessibl, Achim Goepferich, and Miriam Breunig

    ACS Appl. Mater. Interfaces, 7, 7891–7900 (2015)


  1. Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters

    Matthias Emmrich, Ferdinand Huber, Florian Pielmeier, Joachim Welker, Thomas Hofmann, Maximilian Schneiderbauer, Daniel Meuer, Svitlana Polesya, Sergiy Mankovsky, Diemo Ködderitzsch, Hubert Ebert, Franz J. Giessibl

    Science, 348, 308-311 (2015)


  1. Response of the topological surface state to surface disorder in TlBiSe2

    Florian Pielmeier, Gabriel Landolt, Bartosz Slomski, Stefan Muff, Julian Berwanger, Andreas Eich, Alexander A Khajetoorians, Jens Wiebe, Ziya S Aliev, Mahammad B Babanly, Roland Wiesendanger, Jürg Osterwalder, Evgueni V Chulkov, Franz J Giessibl and J Hugo Dil

    New J. Phys, 17, 023067 (2015)


  1. Influence of matrix and filler fraction on biofilm formation
    on the surface of experimental resin-based composites

    Andrei Ionescu, Eugenio Brambilla, Daniel S. Wastl, Franz J. Giessibl, Gloria Cazzaniga, Sibylle Schneider-Feyrer, Sebastian Hahnel

    J Mater Sci: Mater Med, DOI 10.1007/s10856-014-5372-4 (2015)


2014


  1. Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy

    Daniel S. Wastl, Alfred J. Weymouth and Franz J. Giessibl

    ACS Nano, 8, 5233 (2014)

  1. CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces

    Maximilian Schneiderbauer, Matthias Emmrich, Alfred J. Weymouth, and Franz J. Giessibl

    Phys. Rev. Lett., 112, 166102 (2014)

  1. Image correction for atomic force microscopy images with functionalized tips

    M. Neu, N. Moll, L. Gross, G. Meyer, F. J. Giessibl, and J. Repp

    Phys. Rev. B, 89, 205407 (2014)


  1. Streptococcus Mutans Biofilm Formation and Release of Fluoride from Experimental Resin-based Composites Depending on Surface Treatment and S-PRG Filler Particle Fraction

    Hahnel Sebastian, Wastl Daniel S., Schneider-Feyrer Sibylle, Giessibl Franz J., Brambilla Eugenio, Cazzaniga Gloria, Ionescu Andrei

    J Adhes Dent, 16, 313-21 (2014)


  1. Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

    Florian Pielmeier, Daniel Meuer, Daniel Schmid, Christoph Strunk and Franz J. Giessibl

    Beilstein J. Nanotechnol., 5, 407–412 (2014)


  1. Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy

    Thomas Hofmann, Florian Pielmeier and Franz J. Giessibl

    Phys. Rev. Lett, 112, 066101 (2014)

  1. Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy

    A. J. Weymouth, Thomas Hofmann and Franz J. Giessibl

    Science, 343, 1120-1122 (2014)


2013


  1. Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air

    Daniel S. Wastl, Florian Speck, Elisabeth Wutscher, Markus Ostler, Thomas Seyller, and Franz J. Giessibl

    ACS Nano, 7, 10032 (2013)

  1. Atomic Structure Affects the Directional Dependence of Friction

    A. J. Weymouth, D. Meuer, P. Mutombo, T. Wutscher, M. Ondracek, P. Jelinek and F. J. Giessibl

    Phys. Rev. Lett., 111, 126103 (2013)

          Also highlighted in:

                  - Nature

                  - Physics Today

                  - Scientific American Blogs

                  - Physics Central


  1. The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy

    Joachim Welker, Alfred John Weymouth, and Franz J. Giessibl

    ACS Nano, 7, 7377 (2013)

  1. Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers

    T. Wutscher, J. Niebauer, and F. J. Giessibl

    Rev. Sci. Instrum., 84, 073704 (2013)

  1. Abbildung der Symmetrien chemischer Bindungen

    Franz J. Giessibl, Joachim Welker

    Alumnus 2013 Jahrbuch, 6-8 (2013)

  1. Seeing the Reaction

    Franz J. Giessibl

    Science, 340, 1417 (2013)

  1. Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy

    Florian Pielmeier and Franz J. Giessibl

    Phys Rev. Lett., 110, 266101 (2013)

  1. Optimizing atomic resolution of force microscopy in ambient conditions

    Daniel S. Wastl, Alfred J. Weymouth, and Franz J. Giessibl

    Phys. Rev. B, 87, 245415 (2013)

2012


  1. The effect of sample resistivity on Kelvin probe force microscopy

    A. J. Weymouth and F. J. Giessibl

    Appl. Phys. Lett., 101, 213105 (2012)

  1. Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development

    A. Ionescu, E. Wutscher, E. Brambilla, S. Schneider-Feyrer, F. J. Giessibl, S. Hahne

    Eur. J. Oral Sci., 120, 458 (2012)


  1. Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy

    J. Welker, F. J. Giessibl

    Science 336, 444-449 (2012) (full text)

  1. Localization of the phantom force induced by the tunneling current

    T. Wutscher, A. J. Weymouth, F. J. Giessibl

    Phys. Rev. B, 85, 195426 (2012)

  1. Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

    J. Welker, E. Illek, F. J. Giessibl

    Beilstein J. Nanotechnol., 3, 238-248 (2012)


  1. qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

    M. Schneiderbauer, D. Wastl, F. J. Giessibl

    Beilstein J. Nanotechnol., 3, 174-178 (2012)


2011


  1. Atomic Force Microscopy at Ambient and Liquid Conditions with Stiff Sensors and Small Amplitudes

    E. Wutscher, F. J. Giessibl

    Rev. Sci. Instrum., 82, 093703 (2011)

  1. Application of the equipartition theorem to the thermal excitation of quartz tuning forks

    J. Welker, F. de Faria-Elsner, and F. J. Giessibl

    Appl. Phys. Lett., 99, 084102 (2011)


  1. A comparative study of force sensors for scanning probe microscopy based on quartz tuning forks and length extensional resonators

    F. J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa

    Phys. Rev. B, 84, 125409 (2011)

  1. Phantom force induced by tunneling current: A characterization on Si(111)

    A. J. Weymouth, T. Wutscher, J. Welker, T. Hofmann, and F. J. Giessibl

    Phys. Rev. Lett., 106, 226801 (2011)

  1. In Situ Cleavage of Crystallographic Oriented Tips for Scanning Probe Microscopy

    T. Wutscher, F. J. Giessibl

    Rev. Sci. Instrum., 82, 026106 (2011)


  1. Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts

    M. Ternes, C. González, C. P. Lutz, P. Hapala, F. J. Giessibl, P. Jelínek, A. J. Heinrich

    Phys. Rev. Lett., 106, 016802 (2011)

2010


  1. Preparation of light-atom tips for Scanning Probe Microscopy by explosive delamination

    T. Hofmann, J. Welker, F. J. Giessibl

    Journal of Vacuum Science and Technology B 28, C4E28-C4E30 (2010)

  1. Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy

    R. C. Tung, T. Wutscher, D. Martinez-Martin, R. G. Reifenberger, F. J. Giessibl, und A. Raman

    Journal of Applied Physics 107, 104508 (2010)


2009


  1. Auf die Spitze getrieben

    F. J. Giessibl

    Physik Journal 8 , Nr. 11, 20-21 (2009)

  1. Measuring Noncontact Atomic Force Microscopy 2 (Nanoscience and Technology)

    S. Morita, F. J. Giessibl, R. Wiesendanger (editors)

    Springer, Berlin ,2009

  1. Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy

    L. Gross, F. Mohn, P. Liljeroth, J. Repp, F. J. Giessibl, G. Meyer

    Science 324, 1428-1431 (2009)

    YouTube Video: IBM Takes Next Step Towards Building Molecular Device


2008


  1. Rasterkraftmikroskopie: Wie viel Kraft ist nötig, um ein Atom zu bewegen?

    M. Ternes, A. J. Heinrich, F. J. Giessibl

    Physik in unserer Zeit 39, 111-112 (2008)

    YouTube Video: IBM Measures The Force Required To Move Atoms

  1. The Force Needed to Move an Atom on a Surface

    M. Ternes, C. P. Lutz, C. F. Hirjibehedin, F. J. Giessibl, A. J. Heinrich

    Science 319, 1066 (2008)

    YouTube Video: IBM Measures The Force Required To Move Atoms

  1. Searching atomic spin contrast on nickel oxide (001) by force microscopy

    M. Schmid, J. Mannhart, F. J. Giessibl

    Phys. Rev. B 77, 045402 (2008)


2007


  1. Ein atomarer Fingerabdruck

    F. J. Giessibl

    Physik Journal 6 , Nr. 5, 22-23 (2007)

2006


  1. Exploring the Nanoworld with Atomic Force Microscopy

    F. J. Giessibl, C. F. Quate

    Physics Today 59, 44-50 (2006)

  1. Device for in situ cleaving of hard crystals

    M. Schmid, A. Renner, F. J. Giessibl

    Rev. Sci. Instrum. 77, 036101 (2006)


  1. Higher-Harmonic Atomic Force Microscopy

    F. J. Giessibl

    Surf. Interface Anal. 38, 1696-1701 (2006)


2005


  1. AFM´s Path to Atomic Resolution

    F. J. Giessibl

    materials today 8, 32-41 (2005)

  1. Electron Scattering in Scanning Probe Microscopy Experiments

    L. A. Zotti, W. A. Hofer, F. J. Giessibl

    Chemical Physical Letters 420, 177-182 (2006)

  1. Investigating Atomic Details of the CaF2(111) Surface with a qPlus Sensor

    F. J. Giessibl, M. Reichling

    Nanotechnology 16, 118-124 (2005)


  1. Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces and Dissipation on Graphite

    S. Hembacher, F. J. Giessibl, J. Mannhart, C. F. Quate

    Phys. Rev. Lett. 94, 056101 (1-4) (2005)

  1. Simultaneous Current-, Force- and Work-Function Measurement with Atomic Resolution

    M. Herz, C. Schiller, F. J. Giessibl, J. Mannhart

    Applied Physics Letters 86, 153101 (1-3) (2005)

2004


  1. Force Microscopy with Light Atom Probes

    S. Hembacher, F. J. Giessibl, J. Mannhart

    Science 305, 380-383 (2004)


  1. Noncontact Atomic Force Microscopy and its Related Topics

    S. Morita, F. J. Giessibl, Y. Sugawara, H. Hosoi, K. Mukasa, A. Sasahara, H. Onishi

    Chapter 13 in B. Bhushan (Ed.) "Nanotribology and Nanomechanics", Springer Berlin a.o. 2004, 385-411 (2004)

  1. Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy

    F. J. Giessibl

    in P. Siffert, E. F. Krimmel (Eds.) "Silicon, Evolution and Future of a Technology", Springer, Berlin, 191-204 (2004)

  1. Stability Consideration and Implementation of Cantilevers Allowing Dynamic Force Microscopy with Optimal Resolution: the qplus Sensor

    F. J. Giessibl, S. Hembacher, M. Herz, C. Schiller, J. Mannhart

    Nanotechnology 15, S79-S86 (2004)


2003


  1. Advances in Atomic Force Microscopy

    F. J. Giessibl

    Reviews of Modern Physics 75 (3), 949-983 (2003)

  1. Atomic Force Microscopy on Its Way to Adolescence

    F. J. Giessibl

    AIP Conference Proceedings 696 (1), 60-67 (2003)

  1. Principle of High-Resolution Atomic Force Microscopy

    F. J. Giessibl

    34th IFF Spring School 2003, "Fundamentals of Nanoelectronics", ed. by S. Blügel et al. (Schriften des Forschungszentrums Jülich, Reihe Materie und Material, Vol. 14, ISBN 3-89336-319-X , B2.1-B2.12 (2003)


  1. Probing the shape of atoms in real space

    M. Herz, F. J. Giessibl, J. Mannhart

    Physical Review B 68, 045301 (1-7) (2003)

  1. Revealing the Hidden Atom in Graphite by Low-Temperature Atomic Force Microscopy

    S. Hembacher, F. J. Giessibl, J. Mannhart, C. F. Quate

    Proceedings of the National Academy of Sciences PNAS 100, 12539-12542 (2003)


2002


  1. Evaluation of a Force Sensor Based on a Quartz Tuning Fork for Operation at Low Temperatures and Ultra-High Vacuum

    S. Hembacher, F. J. Giessibl, J. Mannhart

    Applied Surface Science 188, 445-449 (2002)

  1. Friction Traced to the Single Atom

    F. J. Giessibl, M. Herz, J. Mannhart

    Proceedings of the National Academy of Sciences 99 (19), 12006-12010 (2002)

  1. Principle of NC-AFM

    F. J. Giessibl

    Noncontact Atomic Force Microscopy, eds. Seizo Morita and Roland Wiesendanger, Ernst Meyer, Springer, Chap. 2, 11-46 (2002)

  1. Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals

    F. J. Giessibl

    Proceedings of Scanning Probe Microscopy, Nishny Novgorod 2002, 172-174 (2002)


2001


  1. A Direct Method to Calculate Tip-Sample Forces from Frequency Shifts in Frequency-Modulation Atomic Force Microscopy

    F. J. Giessibl

    Applied Physics Letters 78, 123-125 (2001)

  1. Imaging of Atomic Orbitals with the Atomic Force Microscope - Experiments and Simulations

    F. J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart

    Annalen der Physik (Leipzig) 10 (11-12), 887-910 (2001)

  1. Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy

    F. J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart

    Proceedings of NC-AFM 2000 Applied Physics A 72, 15-17 (2001)


  1. Rasterkraftmikroskop sieht erstmals in das Innere des Atoms

    F. J. Giessibl

    Spektrum der Wissenschaft April, 12-14 (2001)

2000


  1. Atomic Resolution on Si(111)-(7×7) by Noncontact Atomic Force Microscopy with a Force Sensor based on a Quartz Tuning Fork

    F. J. Giessibl

    Applied Physics Letters 76, 1470-1472 (2000)

  1. Physical Interpretation of Frequency-Modulation Atomic Force Microscopy

    F. J. Giessibl, H. Bielefeldt

    Physical Review B 61, 9968-9971 (2000)


  1. Subatomic Features on the Silicon(111)-(7×7) Surface Observed by Atomic Force Microscopy

    F. J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart

    Science 289, 422-425 (2000)

1999


  1. A Simplified but Intuitive Analytical Model for Intermittent-Contact Mode Force Microscopy Based on Hertzian Mechanics

    H. Bielefeldt, F. J. Giessibl

    Surface Science Letters 440, L863-L867 (1999)

  1. Calculation of the Optimal Imaging Parameters for Frequency Modulation Atomic Force Microscopy

    F. J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart

    Applied Surface Science 140, 352-357 (1999)


  1. Force Microscopy in Vacuum with Atomic Resolution

    F. J. Giessibl

    Proc. STM '99, 10th Int. Conf. of Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy, Edited by Y. Kuk, I.W. Lyo, D. Jeon, S.-I.-Park, 19-20 (1999)

1998


  1. High-Speed Force Sensor for Force Microscopy and Profilometry Utilizing a Quartz Tuning Fork

    F. J. Giessibl

    Applied Physics Letters 73, 3956-3958 (1998)

1997


  1. Forces and Frequency Shifts in Atomic Resolution Dynamic Force Microscopy

    F. J. Giessibl

    Physical Review B 56, 16010-16015 (1997)


  1. Self Oscillating Mode for Frequency Modulation Non-Contact Atomic Force Microscopy

    F. J. Giessibl, M. Tortonese

    Applied Physics Letters 70, 2529-2531 (1997)


1995


  1. Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

    F. J. Giessibl

    Sciece 267, 68-71, (1995)

1994


  1. Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum

    F. J. Giessibl and B. M. Trafas

    Rev. Sci. Instrum. 65, 1923 (1994)


  1. Atomic Force Microscopy in Ultrahigh Vacuum

    Franz Josef Giessibl

    Jpn. J. Appl. Phys. 33, 3726-3734 (1994)

1992


  1. Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

    F. J. Giessibl, G. Binnig

    ULTRAMICROSCOPY 42, 281-289 (1992)

  1. Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy

    F. J. Giessibl

    Phys. Rev. B 45, 13815-13815 (1992)


1991


  1. A low‐temperature atomic force/scanning tunneling microscope for ultrahigh vacuum

    F. J. Giessibl, Ch. Gerber and G. Binnig

    J. Vac. Sci. Technol. B 9, 984 (1991)

  1. STARTSEITE UR

AG Prof. Gießibl

 
W(100)
Sekretariat Petra Wild

Tel: +49 (0)941943-2106

Fax: +49 (0)941943-2754

Raum: PHY 1.1.23

Email: petra1.wild@ur.de