Publications
- Ionescu, Andrei, Brambilla, Eugenio, Wastl, Daniel S., Giessibl, Franz J., Cazzaniga, Gloria, Schneider-Feyrer, Sibylle and Hahnel, Sebastian (2015) Influence of matrix and filler fraction on biofilm formation on the surface of experimental resin-based composites.
Journal of Materials Science: Materials in Medicine: 26, P. 58.
https://dx.doi.org/10.1007/s10856-014-5372-4 - Emmrich, Matthias, Schneiderbauer, Maximilian, Huber, Ferdinand, Weymouth, Alfred J., Okabayashi, Norio and Giessibl, Franz J. (2015) Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip.
Physical Review Letters: 114 (14), P. 146101-146101.
https://dx.doi.org/10.1103/PhysRevLett.114.146101 - Hahnel, Sebastian, Wastl, Daniel S., Schneider-Feyrer, Sibylle, Giessibl, Franz J., Brambilla, Eugenio, Cazzaniga, Gloria and Ionescu, Andrei (2014) Streptococcus mutans biofilm formation and release of fluoride from experimental resin-based composites depending on surface treatment and S-PRG filler particle fraction.
The journal of adhesive dentistry (JAD): 16 (4), P. 313-321.
https://dx.doi.org/10.3290/j.jad.a31800 - Neu, Mathias, Moll, Nikolaj, Gross, Leo, Meyer, Gerhard, Giessibl, Franz J. and Repp, Jascha (2014) Image correction for atomic force microscopy images with functionalized tips.
Physical Review B: 89 (20), P. 205407.
https://dx.doi.org/10.1103/PhysRevB.89.205407 - Schneiderbauer, Maximilian, Emmrich, Matthias, Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces.
Physical Review Letters (PRL): 112, P. 166102-1-166102-5.
https://dx.doi.org/10.1103/PhysRevLett.112.166102 - Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2014) Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy.
ACS NANO: 8 (5), P. 5233-5239.
https://dx.doi.org/10.1021/nn501696q - Pielmeier, Florian, Meuer, Daniel, Schmid, Daniel R., Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures.
Beilstein Journal of Nanotechnology: (5), P. 407-412.
https://dx.doi.org/10.3762/bjnano.5.48 - Hofmann, Thomas, Pielmeier, Florian and Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy.
Physical Review Letters (PRL): 112 (6), P. 066101-1-066101-5.
https://dx.doi.org/10.1103/PhysRevLett.112.066101 - Weymouth, Alfred J., Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy.
Science: 343 (6175), P. 1120-1-1120-5.
https://dx.doi.org/10.1126/science.1249502 - Back, Christian, Fabian, Jaroslav, Giessibl, Franz J., Richter, Klaus and Weiss, Dieter (2014) Spin Spin Spin Around - Der Sonderforschungsbereich 689.
Blick in die Wissenschaft: (29), P. 3-10. - Wastl, Daniel S., Speck, Florian, Wutscher, Elisabeth, Ostler, Markus, Seyller, Thomas and Giessibl, Franz J. (2013) Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air.
ACS Nano: 7 (11), P. 10032-10037.
https://dx.doi.org/10.1021/nn403988y - Weymouth, Alfred J., Meuer, Daniel, Mutombo, Pingo, Wutscher, Thorsten, Ondracek, Martin, Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction.
Physical Review Letters: 111 (12), P. 126103.
https://dx.doi.org/10.1103/PhysRevLett.111.126103 - Welker, Joachim, Weymouth, Alfred J. and Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy.
ACS NANO: 7 (8), P. 7377-7382.
https://dx.doi.org/10.1021/nn403106v - Wutscher, Thorsten, Niebauer, Johannes and Giessibl, Franz J. (2013) Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers.
Review of Scientific Instruments: 84, P. 073704-1.
https://dx.doi.org/10.1063/1.4812636 - Pielmeier, Florian and Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy.
Physical Review Letters (PRL): 110 (26), P. 266101-1-266101-5.
https://dx.doi.org/10.1103/PhysRevLett.110.266101 - Giessibl, Franz J. (2013) Seeing the Reaction.
Science: 340 (6139), P. 1417-1418.
https://dx.doi.org/10.1126/science.1239961 - Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions.
Physical Review B (PRB): 87 (24), P. 245415-1-245415-10.
https://dx.doi.org/10.1103/PhysRevB.87.245415 - Weymouth, Alfred Jay and Giessibl, Franz J. (2012) The effect of sample resistivity on Kelvin probe force microscopy.
Applied Physics Letters: 101, P. 213105-1.
https://dx.doi.org/10.1063/1.4766185 - Ionescu, Andrei, Wutscher, Elisabeth, Brambilla, Eugenio, Schneider-Feyrer, Sibylle, Giessibl, Franz J. and Hahnel, Sebastian (2012) Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development.
European Journal Of Oral Sciences: 120 (5), P. 458-465.
https://dx.doi.org/10.1111/j.1600-0722.2012.00983.x - Wutscher, Thorsten, Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current.
Physical Review B (PRB): 85 (19), P. 195426-1-195426-6.
https://dx.doi.org/10.1103/PhysRevB.85.195426 - Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy.
Science: 336 (608), P. 444-449.
https://dx.doi.org/10.1126/science.1219850 - Welker, Joachim, Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy.
Beilstein Journal of Nanotechnology: 3, P. 238-248.
https://dx.doi.org/10.3762/bjnano.3.27 - Schneiderbauer, Maximilian, Wastl, Daniel S. and Giessibl, Franz J. (2012) qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution.
Beilstein Journal of Nanotechnology: 3, P. 174-178.
https://dx.doi.org/10.3762/bjnano.3.18 - Giessibl, Franz J., Pielmeier, Florian, Eguchi, Toyoaki, An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators.
Physical Review B (PRB): 84 (12), P. 125409-1-125409-15.
https://dx.doi.org/10.1103/PhysRevB.84.125409