Publikationen
- Weymouth, Alfred J., Wutscher, Thorsten, Welker, Joachim, Hofman, Thomas und Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111).
Physical Review Letters (PRL): 106 (22), S. 226801-1-226801-4.
https://dx.doi.org/10.1103/PhysRevLett.106.226801 - Ternes, Markus, González, César, Lutz, Christopher P., Hapala, Prokop, Giessibl, Franz J., Jelinek, Pavel und Heinrich, Andreas J. (2011) Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts.
Physical Review Letters (PRL): 106 (1), S. 016802-1-016802-4.
https://dx.doi.org/10.1103/PhysRevLett.106.016802 - Welker, Joachim, de Faria Elsner, Frederico und Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks.
Applied Physics Letters: 99, S. 084102.
https://dx.doi.org/10.1063/1.3627184 - Wutscher, Elisabeth und Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes.
Review of Scientific Instruments: 82, S. 093703.
https://dx.doi.org/10.1063/1.3633950 - Wutscher, Thorsten und Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy.
Review of Scientific Instruments: 82 (2), S. 026106.
https://dx.doi.org/10.1063/1.3549628 - Tung, Raimond C., Wutscher, Thorsten, Martinez-Martin, David, Reifenberger, Ronald G., Giessibl, Franz J. und Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy.
Journal of Applied Physics: 107 (10), S. 104508-1-104508-8.
https://dx.doi.org/10.1063/1.3407511 - Hofmann, Thomas, Welker, Joachim und Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination.
Journal of Vacuum Science & Technology B: 28 (3), S. C4E28-C4E30.
https://dx.doi.org/10.1116/1.3294706 - Gross, Leo, Mohn, Fabian, Meyer, Gerhard, Repp, Jascha und Giessibl, Franz J. (2009) Atomare Ladungszustände unter dem Rasterkraftmikroskop.
Physik in unserer Zeit: 40 (5), S. 225-226.
https://dx.doi.org/10.1002/piuz.200990086 - Giessibl, Franz J. (2009) Principles and Applications of the qPlus Sensor.
: (6), S. 121-142. ISBN 978-3-642-01495-6.
https://dx.doi.org/10.1007/978-3-642-01495-6_6 - Gross, Leo, Mohn, Fabian, Liljeroth, Peter, Repp, Jascha, Giessibl, Franz J. und Meyer, Gerhard (2009) Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy.
Science: 324 (5933), S. 1428-1431.
https://dx.doi.org/10.1126/science.1172273 - Ternes, Markus, Heinrich, Andreas J. und Giessibl, Franz J. (2008) Wie viel Kraft ist nötig, um ein Atom zu bewegen?.
Physik in unserer Zeit: 39 (3), S. 111-112.
https://dx.doi.org/10.1002/piuz.200890021 - Ternes, Markus, Lutz, Christopher P., Hirjibehedin, Cyrus F., Giessibl, Franz J. und Heinrich, Andreas J. (2008) The Force Needed to Move an Atom on a Surface.
Science: 319 (5866), S. 1066-1069.
https://dx.doi.org/10.1126/science.1150288 - Schmid, Martin, Mannhart, Jochen und Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy.
Physical Review B (PRB): 77 (4), S. 045402-1-045402-6.
https://dx.doi.org/10.1103/PhysRevB.77.045402 - Giessibl, Franz J. und Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy.
Physics today: 59 (12), S. 44-50.
https://dx.doi.org/10.1063/1.2435681 - Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy.
Surface and Interface Analysis: 38 (12-13), S. 1696-1701.
https://dx.doi.org/10.1002/sia.2392 - Schmid, Martin, Renner, Andreas und Giessibl, Franz J. (2006) Device for in situ cleaving of hard crystals.
Review of Scientific Instruments: 77 (3), S. 036101-1-036101-7.
https://dx.doi.org/10.1063/1.2166670 - Zotti, Linda A., Hofer, Werner A. und Giessibl, Franz J. (2006) Electron scattering in scanning probe microscopy experiments.
Chemical Physics Letters: 420 (1-3), S. 177-182.
https://dx.doi.org/10.1016/j.cplett.2005.12.065 - Giessibl, Franz J. (2005) AFM's path to atomic resolution.
Materials Today: 8 (5), S. 32-41.
https://dx.doi.org/10.1016/S1369-7021(05)00844-8 - Herz, Markus, Schiller, Christian H., Giessibl, Franz J. und Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution.
Applied Physics Letters: 86 (15), S. 153101-1-153101-3.
https://dx.doi.org/10.1063/1.1900316 - Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite.
Physical Review Letters (PRL): 94 (5), S. 056101-1-056101-4.
https://dx.doi.org/10.1103/PhysRevLett.94.056101 - Giessibl, Franz J. und Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor.
Nanotechnology: 16 (3), S. 118-124.
https://dx.doi.org/10.1088/0957-4484/16/3/022 - Morita, Seizo, Giessibl, Franz J., Sugawara, Yasuhiro, Hosoi, Hirotaka, Mukasa, Koichi, Sasahara, Akira und Onishi, Hiroshi (2005) Noncontact Atomic Force Microscopy and its Related Topics.
: (13), S. 385-411. ISBN 978-3-540-24267-3. - Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes.
Science: 305 (5682), S. 380-383.
https://dx.doi.org/10.1126/science.1099730