Publikationen
- Giessibl, Franz J., Hembacher, Stefan, Herz, Markus, Schiller, C. H. und Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor.
Nanotechnology: 15 (2), S. 79-86.
https://dx.doi.org/10.1088/0957-4484/15/2/017 - Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy.
, S. 191-204. ISBN 3-540-40546-1. - Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence.
AIP Conference Proceedings: 696 (1), S. 60-67.
https://dx.doi.org/10.1063/1.1639678 - Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy.
Proceedings of the National Academy of Sciences of the United States of America (PNAS): 100 (22), S. 12539-12542.
https://dx.doi.org/10.1073/pnas.2134173100 - Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy.
Reviews of Modern Physics (RMP): 75 (3), S. 949-983.
https://dx.doi.org/10.1103/RevModPhys.75.949 - Herz, Markus, Giessibl, Franz J. und Mannhart, F. (2003) Probing the shape of atoms in real space.
Physical Review B (PRB): 68 (4), S. 045301-1-045301-7.
https://dx.doi.org/10.1103/PhysRevB.68.045301 - Giessibl, Franz J. (2003) Principle of High-Resolution Atomic Force Microscopy.
: 14 (B2), ISBN 3-89336-319-X. - Giessibl, Franz J., Herz, Markus und Mannhart, Jochen (2002) Friction traced to the single atom.
Proceedings of the National Academy of Sciences of the United States of America (PNAS): 99 (19), S. 12006-12010.
https://dx.doi.org/10.1073/pnas.182160599 - Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum.
Applied Surface Science: 188 (3-4), S. 445-449.
https://dx.doi.org/10.1016/S0169-4332(01)00976-X - Giessibl, Franz J. (2002) Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals.
: 2002,5/6, S. 172-174. - Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations.
Annalen der Physik: 10 (11-12), S. 887-910.
https://dx.doi.org/10.1002/1521-3889(200111)10:11/12<887::AID-ANDP887>3.0.CO;2-B - Giessibl, Franz J. (2001) Rasterkraftmikroskop sieht erstmals ins Innere des Atoms.
Spektrum der Wissenschaft: 2001 (April), S. 12-14. - Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips.
Applied Physics A: Materials Science & Processing: 72 (Suppl1), S. 15-17.
https://dx.doi.org/10.1007/s003390100627 - Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy.
Applied Physics Letters: 78 (1), S. 123-125.
https://dx.doi.org/10.1063/1.1335546 - Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy.
Science: 289 (5478), S. 422-425.
https://dx.doi.org/10.1126/science.289.5478.422 - Giessibl, Franz J. und Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy.
Physical Review B (PRB): 61 (15), S. 9968-9971.
https://dx.doi.org/10.1103/PhysRevB.61.9968 - Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork.
Applied Physics Letters: 76 (11), S. 1470-1472.
https://dx.doi.org/10.1063/1.126067 - Bielefeldt, Hartmut und Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics.
Surface Science: 440 (3), S. L863-L867.
https://dx.doi.org/10.1016/S0039-6028(99)00861-4 - Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy.
Applied Surface Science: 140 (3-4), S. 352-357.
https://dx.doi.org/10.1016/S0169-4332(98)00553-4 - Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork.
Applied Physics Letters: 73 (26), S. 3956-3958.
https://dx.doi.org/10.1063/1.122948 - Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy.
Physical Review B (PRB): 56 (24), S. 16010-16015.
https://dx.doi.org/10.1103/PhysRevB.56.16010 - Giessibl, Franz J. und Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy.
Applied Physics Letters: 70 (19), S. 2529-2531.
https://dx.doi.org/10.1063/1.118910 - Giessibl, Franz J. (1995) Atomic Resolution of the Silicon (111 )-(7x 7) Surface by Atomic Force Microscopy.
Science: 267 (5194), S. 68-71.
https://dx.doi.org/10.1126/science.267.5194.68