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• "Force Microscopy in Vacuum with Atomic Resolution", Giessibl, 1999

  Publication

  Publication on epub.uni-regensburg.de: "Force Microscopy in Vacuum with Atomic Resolution" (external link, opens in a new window)

• "Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy", Giessibl, Bielefeldt, Hembacher, Mannhart, 1999

  Publication

  True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the...

  Publication on epub.uni-regensburg.de: "Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy" (external link, opens in a new window)

• "A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics", Bielefeldt, Giessibl, 1999

  Publication

  The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct...

  Publication on epub.uni-regensburg.de: "A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics" (external link, opens in a new window)

• "Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork", Giessibl, 2000

  Publication

  Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of...

  Publication on epub.uni-regensburg.de: "Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork" (external link, opens in a new window)

• "Physical interpretation of frequency-modulation atomic force microscopy", Giessibl, Bielefeldt, 2000

  Publication

  Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with...

  Publication on epub.uni-regensburg.de: "Physical interpretation of frequency-modulation atomic force microscopy" (external link, opens in a new window)

• "Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy", Giessibl, Hembacher, Bielefeldt, Mannhart, 2000

  Publication

  The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by...

  Publication on epub.uni-regensburg.de: "Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy" (external link, opens in a new window)

• "A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy", Giessibl, 2001

  Publication

  Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the...

  Publication on epub.uni-regensburg.de: "A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy" (external link, opens in a new window)

• "Imaging silicon by atomic force microscopy with crystallographically oriented tips", Giessibl, Hembacher, Bielefeldt, Mannhart, 2001

  Publication

  The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of...

  Publication on epub.uni-regensburg.de: "Imaging silicon by atomic force microscopy with crystallographically oriented tips" (external link, opens in a new window)

• "Rasterkraftmikroskop sieht erstmals ins Innere des Atoms", Giessibl, 2001

  Publication

  Mit einem neuartigen Messfühler in Form einer Stimmgabel ist es gelungen, eine Siliziumoberfläche mit bisher nicht erreichter Auflösung abzutasten und...

  Publication on epub.uni-regensburg.de: "Rasterkraftmikroskop sieht erstmals ins Innere des Atoms" (external link, opens in a new window)

• "Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations", Giessibl, Bielefeldt, Hembacher, Mannhart, 2001

  Publication

  Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing...

  Publication on epub.uni-regensburg.de: "Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations" (external link, opens in a new window)